Litesizer-Serie von Anton Paar

Particle systems place different demands on analysis depending on their size, sample type, and the analytical question at hand. What they have in common is that particle size is a key parameter for characterizing materials, ensuring quality, and systematically improving products and processes.

However, the same measurement principle is not suitable for every sample and every analytical question. With the Litesizer product family, Anton Paar offers three technologies for particle size analysis: dynamic light scattering (DLS), laser diffraction (DIF), and dynamic image analysis (DIA). Together, they cover particles from the nanometer to the millimeter range.

• Litesizer DLS – one instrument, many possibilities: The series combines particle size determination with a wide range of additional measurement parameters. In addition to particle size, zeta potential, particle concentration, molecular weight, refractive index, and transmittance can be determined. A sample volume starting from 1.5 µL enables analyses even when sample quantities are limited or valuable. For zeta potential measurements, the patented cmPALS technology provides high precision at low voltages and short measurement times. The Litesizer DLS 701 additionally combines multiple measurement angles using MAPS for higher resolution of polydisperse samples.

• Litesizer DIF – a broad measurement range combined with additional shape information: The series uses laser diffraction to analyze particles from 10 nm to 3,500 µm and comes with a 10-year warranty on the lasers. Wet and dry dispersion enable the analysis of a wide variety of samples. For additional information, laser diffraction can be combined with dynamic image analysis. This allows particle size and shape to be determined in a single measurement.

• Litesizer DIA – making individual particles visible: Dynamic image analysis determines not only particle size but also characterizes the shape of individual particles. Three lenses provide a continuous measurement range from 0.5 µm to 16,000 µm in a single measurement without the need for modification. Switching between wet and dry dispersion takes just one simple step. Powerful filter functions enable direct comparison of different size and shape parameters and help users investigate relevant particle populations or replicate sieving results.

• Automated particle analysis for higher sample throughput: All three Litesizer series can be combined with an autosampler. This enables recurring measurement workflows to be automated and reduces manual sample handling. This saves valuable working time and ensures standardized workflows.

• One software platform connects the Litesizer family: All Anton Paar particle analysis instruments are controlled using Kalliope software. The consistent software environment simplifies organization, measurement, and evaluation while reducing the effort required when working with different analysis technologies.

Whether in research and development or quality control, the Litesizer product family does not simply offer one method for every sample, but the right analysis for your specific analytical question. This turns complex particle systems into a reliable basis for better decisions.