A sharper look at the interior of semiconductors
A research team is developing a high-resolution imaging technique that can be used to determine internal structures in materials and their chemical composition in a non-destructive manner and with nanometre precision
19-Feb-2021 -
Images provide information – what we can observe with our own eyes enables us to understand. Constantly expanding the field of perception into dimensions that are initially hidden from the naked eye, drives science forward. Today, increasingly powerful microscopes let us see into the cells and ...
imaging
optical coherence tomograph
semiconductors
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