Scanning Electron Microscopes

News Scanning Electron Microscopes

  • Microscopy Today Innovation Award for ZEISS microscope

    ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award.As the first multiple-beam scanning electron microscope (SEM) in the world, the system uses 61 beams simultaneously, and offers a capture speed of up t more

  • New microscope sees what others can't

    Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, scanning electron microscopes (SEMs) simply can't see materials that don't conduct electricity very well, and their high energies can actually damage some types of samples. In an effort to extract a li more

  • Scientists home in on lithium battery safety flaws

    Scientists at Cambridge have developed a simple, accurate way of "seeing" chemistry in action inside a lithium-ion battery. By helping them understand how these batteries behave under different conditions the new method – which involves Nuclear Magnetic Resonance (NMR) spectroscopy – could help res more

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