NIST Unveils Atom-based Standards For Measuring Chip Features Under 50 Nanometers
01-Mar-2005 -
Device features on computer chips as small as 40 nanometers (nm) wide-less than one-thousandth the width of a human hair-can now be measured reliably thanks to new test structures developed by a team of physicists, engineers, and statisticians at the Commerce Department's National Institute of ...
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