Scanning electron microscopes:
JEOL SEM-Series: JSM-IT210 - JSM-IT710 - JSM-IT810
Fast results. Maximum automation. Minimal training required. JEOL scanning electron microscopes
JEOL (Germany) GmbH
Resolution up to 0.5 nm at 150 kV (JSM-IT-810) for highly detailed structural analysis
Sample current ≥ 500 nA (JSM-IT810 SHL) for extremely fast analysis
Fully automatic image capture and particle analysis saves up to 80% of working time
Optimized workflows, integrated EDS analysis and 3D reconstruction for beginners to professionals
See more. Achieve more. Quite simply.
Whether investigating new microchips, uncovering complicated biological structures, polymer research, asbestos, trace smoke or damage analysis - choosing a modern scanning electron microscope from JEOL is always the right decision!
The SEMs developed by JEOL ideally cover R&D requirements from nm to sub-nm range. With flexibility, a wide range of options and an exceptionally long service life, JEOL devices are perfect for quality assurance and product development - in industry, research and education. From our most powerful flagship field emission SEM with ultimate resolution, magnification and analytical flexibility to the user-friendly entry-level benchtop SEM, JEOL has the right instrument for your application.
From the intuitive entry-level SEM to the high-end FEG-SEM - a family for all applications.
Whether routine quality control, materials research, life sciences or nanotechnology: the JEOL SEM series offers powerful imaging, intelligent automation and simple operation at every level.
One platform. Every performance level.
From the compact NeoScope to the versatile JSM-IT210 InTouchScope to the flagship JSM-IT810 FE-SEM - increase your performance without complicating operation.
Fast results, minimal training required
Automatic adjustment, intelligent navigation and workflow-oriented software reduce set-up times and simplify operation - ideal for multi-user laboratories.
Integrated analytics
High-resolution imaging combined with EDS and advanced detector systems provides structural and elemental information in an end-to-end workflow.
Made for beginners. Designed for experts.
Simple enough for first-time users.
Powerful enough for cutting-edge research.
Your application. Your demand. One JEOL SEM family.
Experience the JSM-IT210 InTouchScope live at analytica and discover how intuitive operation meets powerful imaging and integrated EDS analysis. bring your own sample and test the system directly on site. Our application specialists will accompany you from sample insertion to the final result.
Visit us in Hall A2, Stand 210 - and turn your sample into real insights.
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Automation at its Best: Automatic Observation and Analysis Function + Automatic Calibration Function + Live 3D Function + EDS Integration (JSM-IT810)
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Wide range of applications, from entry-level desktop devices to high-resolution field-emission-SEMs
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A scanning electron microscope from JEOL for every application and requirement.
Experience this product live at the trade fair
Request information about JEOL SEM-Series: JSM-IT210 - JSM-IT710 - JSM-IT810 now
Scanning electron microscopes: JEOL SEM-Series: JSM-IT210 - JSM-IT710 - JSM-IT810
Fast results. Maximum automation. Minimal training required. JEOL scanning electron microscopes
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Topic World Particle Analysis
Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!
Topic World Particle Analysis
Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!
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