Sample Preparation

If sample material is not adequately prepared, the ensuing analytical detection step will fail to yield accurate results. To prevent this from happening, often tiring work procedures need to be performed. These can be avoided when using dedicated instruments, such as mills, microwave digestion systems or sample concentrators as well as readily prepared solutions or kits. This not only makes detection easier but also ensures that the results are reproducible.

Products Sample Preparation

Premium Disk Mill for Sample Preparation for Efficient Fine Grinding Down to 50 µm!

Ideal for hard-brittle to medium-hard solids: Easy to operate and especially safe due to automatic safety locks of the grinding chamber and drawer more

State-of-the-art sample preparation for analytical laboratories. Safe, quick and efficient

State-of-the-art sample preparation for analytical laboratories from Anton Paar. Safe, quick and efficient – Multiwave PRO | Multiwave ECO more

Fusion Technology for X-Ray Fluorescence Analysis

FLUXANA offers its customers electrical and gas operated fusion systems. Fusion is used to achieve highest precision for analysis with XRF or ICP more

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Videos Sample Preparation

FRITSCH Planetary Mills premium line - for grinding down to the nanometer range!

Discover with the new FRITSCH premium line a completely new dimension in high-tech milling. For the first time ever, never known before, rotational speeds and ultrafine grinding results down into the nano range are achieved. Due to the time-saving premium grinding bowl locking-system, the automatic more

PIRO® - your personal pipetting robot

Meet DORNIER-LTF DORNIER-LTF, a daughter company of the German manufacturer DORNIER with tenth of years of experience in building robotics equipment has taken care to provide a pipetting solution which has led to the recently released pipetting system, the PIRO®. Built by experienced engineers, the more

Premium Disk Mill for Sample Preparation for Efficient Fine Grinding Down to 50 µm!

The premium model of the FRITSCH Disk Mill for efficient fine grinding of hard-brittle to medium-hard solids: Even safer due to the automatic locking of the collecting vessel and grinding chamber, even easier to operate due to the convenient motor-driven grinding gap adjustment with digital gap disp more

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News Sample Preparation

  • Plastics analysis at analytica 2014: Optimum quality assurance thanks to the latest developments

    Modern and functional materials play an increasingly important role in our everyday lives – from medical instruments and consumer goods to industrial high-tech products in the electronics and automotive industries. Complex materials testing and quality control call for increasingly sophisticated dev more

  • Raman keeps lipstick evidence in the bag

    Scientists at the University of Kent, UK have used Raman spectroscopy to identify different types and brands of lipstick on crime scene evidence without having to remove it from the evidence bag. Lipstick marks can link someone to a crime scene and can be crucial for establishing physical contact be more

  • Super-sensitive detection of asbestos in soil samples

    A new method of sample preparation, developed by a group of US scientists, promises to increase the sensitivity of asbestos analysis 100-fold, to the point where it can be used to detect the substance in soil. Although at a low level, asbestos contamination in soil is of potential concern. If such s more

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White papers Sample Preparation

  • On-line particle analysis in wet processes

    Fully automated particle size measurement technology integrated with existing plant control platforms for ease of use has the potential to deliver numerous benefits. At plants where a switch to on-line analysis has been made it is frequently easier or possible to: more

  • The Determination of Hazardous Substances According to RoHS and WEEE Directives

    1st July 2006 is an important deadline for the electro- and electronics industries. This date bans hazardous substances like lead, cadmium, mercury, hexavalent chromium and polybrominated biphenyls and diphenyl ethers from electro- and electronic equipment. This restriction, even though in discussion since 1991, has become more and more important from year to year because of tons of electronic waste releasing toxic substances which are accumulated in the environment, the food chain and all human beings. In order to enforce the substances ban and the limitation or substitution of hazardous components, elemental analysis is obviously the most important control measure for monitoring limiting values. This requires precise analytical systems such as X-ray fluorescence, ICP- and atomic absorption spectrometers. These instruments are able to detect trace concentrations of hazardous compounds - for example cadmium, using an atomic absorption spectrometer in the flame atomization mode up to 0.1 mg/L, or using the di more

  • Sum parameters "on trail"

    Identification of organic pollutants in wastewater is essential for performance evaluation, construction and operation of a wastewater treatment plant. Several parameters are currently used in wastewater analysis applications. The advantages of TOC analyses are apparent especially during continuous monitoring more

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Events Sample Preparation

Websites Sample Preparation

Cell Biosciences

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Welcome to Don Whitley Scientific - Manufacturing & Selling Anaerobic Workstations, Design, Microbio

Home About DWS Overview Company profile Location & map People Job Opportunities Links Microbiology Organisation Publications Sales Overview Refurbished Products Testimonials Feedback Faqs News Press Releases Archive Exhibition Dates Search Products PRODUCT CATALOGUE Whitley Workstations Bacterial En more

Ionicon PTR-MS Home - The Solution for Real-Time Trace Gas Analysis

Products Technology Applications Documentation About Us Support The Solution for Real-Time Trace Gas Analysis Welcome! We are the world's leading PTR-MS (Proton Transfer Reaction - Mass Spectrometry) company. THE online mass spectrometry technology for monitoring and absolute quantification of volat more

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