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Big Improvements in Laser Diffraction Help You Spot Small Differences

Best-in-class particle size distribution data from 10 nm - 3.000 µm with just 2 clicks

For big improvements that help you spot small differences.The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology, which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR analyzer provides fast, accurate ...

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