SPECTROGREEN ICP-OES: Revolutionary Dual Side-On Interface (DSOI) Technology
Thanks to DSOI technology twice the sensitivity of conventional radial-plasma-view instruments
TI enables highest sensitivity for trace elements, as well as freedom from matrix interferences
Extremely agile, LDMOS generator without external cooling – faster warmup for higher productivity
Now Available in Three Versions – for maximum flexibility with a convincing price-performance ratio
SPECTROGREEN ICP-OES is available in 3 versions: revolutionary Dual Side-On Interface (DSOI), Twin Interface (TI) or Side-On-Plasma (SOP) technology.
The Twin Interface model automatically combines both axial and radial plasma views — looking both across the plasma and from end-to-end — optimizing sensitivity, linearity, and dynamic range while avoiding matrix effects like EIE. The result: SPECTROGREEN TI offers the highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices.
ICP mass spectrometers
SPECTRO Analytical Instruments GmbH announced that Dr. Christoph Mätzig has been named to succeed Manfred Bergsch as Managing Director. Bergsch retired on July 1, 2016, and Dr. Mätzig has assumed his responsibilities at SPECTRO, a leading manufacturer of measurement instruments for elementa ... more
SPECTRO Analytical Instruments, a leading manufacturer of advanced instruments for elemental analysis, has announced a major milestone — the shipment of its 40,000th spectrometer. The “milestone instrument,” a SPECTRO ARCOS state-of-the-art optical emission spectrometer with inductively cou ... more
SPECTRO Analytical Instruments announced that it has been acquired by AMETEK, Inc., a leading global manufacturer of electronic instruments and electric motors. SPECTRO was acquired from an investor group led by German Equity Partners BV for approximately EUR80 million ($98 million). With i ... more
nstead of the compromised, overspecialized ICP-OES and ED-XRF instruments that many university labs have applied in the past, a new class of instrumen more
This paper provides an in-depth comparison of these two long-established technologies used in a wide variety of elemental analysis applications more
This paper reviews the concepts surrounding the optical interfaces that are available for ICP-OES spectrometers and discusses the relative strengths more
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