Measurement range 5 µm – 20 mm ✓ Modern software ✓ Individual image analysis in microscopy quality ✓ Fast evaluation ✓ Optional wet dispersion unit ✓ more
Excellent resolution of narrow or multimodal size distributions ✓ Detection of smallest amounts of oversized or undersized grains ✓ Fully comparable to sieve analysis and laser diffraction results more
Wide measurement range from 0.01 µm to 4 mm thanks to tri-laser technology ✓ High sensitivity and reliable detection of oversized grains ✓ Image analysis provides valuable information on particle morphology more
Anton Paar expands the product portfolio for particle characterization by the acquisition of the corresponding division from CILAS (Orléans, France). The PSA instruments are based on the light scattering principle or image analysis. They give information about the size distribution and shape of part more
Malvern Instruments has launched a new generation image analysis system for the fully automated characterization of particle shape and size. Particle shape analysis has become a critical parameter in many industrial processes. This has fuelled a demand for increasingly flexible analytical systems th more
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