8 Current news about the topic scanning electron microscopes

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Microscopy Today Innovation Award for ZEISS microscope

07-Aug-2015

ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award.As the first multiple-beam scanning electron microscope (SEM) in the world, the system uses 61 beams simultaneously, and offers a capture speed of ...

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New microscope sees what others can't

12-May-2014

Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, scanning electron microscopes (SEMs) simply can't see materials that don't conduct electricity very well, and their high energies can actually damage some types of samples. In an effort to extract a ...

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Scientists home in on lithium battery safety flaws

18-May-2010

Scientists at Cambridge have developed a simple, accurate way of "seeing" chemistry in action inside a lithium-ion battery. By helping them understand how these batteries behave under different conditions the new method – which involves Nuclear Magnetic Resonance (NMR) spectroscopy – could help ...

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Researchers find better way to manufacture fast computer chips

06-Apr-2009

Engineers at Ohio State University are developing a technique for mass producing computer chips made from the same material found in pencils. Experts believe that graphene -- the sheet-like form of carbon found in graphite pencils -- holds the key to smaller, faster electronics. It might also ...

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UK scientists help museum curators to determine Viking trade routes by the metal in their swords

07-Jan-2009

Scientists at the National Physical Laboratory (NPL) in Teddington have worked with the Wallace Collection to analyse the contents of Viking swords – and the results shed new light on trade routes in the middle ages. Curators at the collection were researching the steel structure of ancient ...

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NIST studies how new helium ion microscope measures up

08-Sep-2008

Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the newest microscope technology to further improve measurement accuracy at the nanoscale. Better nanoscale measurements are critical for setting standards ...

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Bruker AXS Wins Prestigious R&D 100 Award For Novel XFlash QUAD Detector for X-ray Microanalysis on Electron Microscopes

28-Jul-2006

Bruker AXS Inc. announced that R&D Magazine has selected its novel XFlash(R) QUAD detector for a 2006 R&D 100 Award. The R&D 100 awards recognize the most technologically significant products introduced into the marketplace during the past year. The XFlash QUAD detector is a key component of ...

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World's smallest universal material testing system

26-Sep-2005

The design, development and manufacturing of revolutionary products such as the automobile, airplane and computer owe a great deal of their success to the large-scale material testing systems (MTS) that have provided engineers and designers with a fundamental understanding of the mechanical ...

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