9 Current news about the topic scanning electron microscopes
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17-Jul-2018
Yale is adding microscopy that provides an unprecedented view of specimens whose thickness had thwarted close inspection Biological structures exist and function in three dimensions, but the limitations of imaging technology have long meant that scientists could examine only two dimensions in ...
07-Aug-2015
ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award.As the first multiple-beam scanning electron microscope (SEM) in the world, the system uses 61 beams simultaneously, and offers a capture speed of ...
12-May-2014
Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, scanning electron microscopes (SEMs) simply can't see materials that don't conduct electricity very well, and their high energies can actually damage some types of samples. In an effort to extract a ...
18-May-2010
Scientists at Cambridge have developed a simple, accurate way of "seeing" chemistry in action inside a lithium-ion battery. By helping them understand how these batteries behave under different conditions the new method – which involves Nuclear Magnetic Resonance (NMR) spectroscopy – could help ...
06-Apr-2009
Engineers at Ohio State University are developing a technique for mass producing computer chips made from the same material found in pencils. Experts believe that graphene -- the sheet-like form of carbon found in graphite pencils -- holds the key to smaller, faster electronics. It might also ...
07-Jan-2009
Scientists at the National Physical Laboratory (NPL) in Teddington have worked with the Wallace Collection to analyse the contents of Viking swords – and the results shed new light on trade routes in the middle ages. Curators at the collection were researching the steel structure of ancient ...
08-Sep-2008
Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the newest microscope technology to further improve measurement accuracy at the nanoscale. Better nanoscale measurements are critical for setting standards ...
28-Jul-2006
Bruker AXS Inc. announced that R&D Magazine has selected its novel XFlash(R) QUAD detector for a 2006 R&D 100 Award. The R&D 100 awards recognize the most technologically significant products introduced into the marketplace during the past year. The XFlash QUAD detector is a key component of ...
26-Sep-2005
The design, development and manufacturing of revolutionary products such as the automobile, airplane and computer owe a great deal of their success to the large-scale material testing systems (MTS) that have provided engineers and designers with a fundamental understanding of the mechanical ...
