AFM Tips from the Microwave
Chemists from the Jena University (Germany) improve the process for the fabrication of sharp Atomic Force Microscopy tips
28-Oct-2010 -
Scientists from the Friedrich-Schiller-University Jena (Germany) were successful in improving a fabrication process for Atomic Force Microscopy (AFM) probe tips.
Atomic Force Microscopy is able to scan surfaces so that even tiniest nano structures become visible. Knowledge about these structures ...
atomic force microscopy
carbon
carbon nanotubes
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