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SAXSess for nanostructure analysis

Small-angle X-ray scattering (SAXSess) is a powerful and non-destructive technique that allows to investigate nanostructures of 1 nm to 100 nm size dispersed in a matrix material. The method provides information on e.g. shape and size of the structures; the porosity as well as the crystallinity or order of the material.

In a SAXSess experiment, the sample is irradiated with an X-ray beam, which is scattered to different angles by the particles, and subsequently intercepted by the detector. The scattering pattern as a function of the scattering angle is characteristic of the size and symmetry of the particles under investigation.

Understanding the inner arrangement of nanostructures is necessary for allocating the properties responsible for specific characteristics of a material. SAXSess can be used in a number of different applications, including investigations of nanopowders, polymers and blends, fibres, catalysts, membranes and biological samples.

The extremely compact design of SAXSess makes use of high-quality components and state-of-the-art X-ray optics and detection systems. Though compact in form, the instrument still offers great versatility, a large measurement range from 0.1° to 40°, and a high X-ray intensity resulting in short measurement times.

The system includes a selection of sample holders that allow the investigation of various samples under special conditions, e.g. in a vacuum, with controlled humidity, and at high/low temperatures.

SAXSess offers dedicated software packages for acquisition (SAXSquant TM) and interpretation (PCG software) of the scattering data. Fully customizable templates allow automatically performed standard calculations, thus getting the most out of your data.