Metrology

News Metrology

  • ZEISS and EPFL begin long-term research collaboration

    ZEISS will support innovative research projects at the Swiss Federal Institute of Technology in Lausanne (École polytechnique fédérale de Lausanne, abbr. EPFL). The company will make one million euros available for new research projects in key technology fields such as biomedical research, medical d more

  • Measurement of the dynamic mechanical properties of viscous materials

    In microsystems metallic components are increasingly being replaced by those from low-cost polymers. For the thickness measurement of polymers, there is now the DIN standard 32567 available, which describes both, optical and tactile surface measuring methods for the precise measurement of the thickn more

  • Bruker completes acquisition of Jordan Valley Semiconductors Ltd.

    Bruker Corporation announced the closing of its acquisition of Jordan Valley Semiconductors Ltd., a major provider of X-ray metrology and defect-detection equipment for semiconductor process control. The addition of Jordan Valley’s innovative in-line X-ray metrology to Bruker’s existing X-ray metrol more

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