Metrology

News Metrology

  • Bruker completes acquisition of Jordan Valley Semiconductors Ltd.

    Bruker Corporation announced the closing of its acquisition of Jordan Valley Semiconductors Ltd., a major provider of X-ray metrology and defect-detection equipment for semiconductor process control. The addition of Jordan Valley’s innovative in-line X-ray metrology to Bruker’s existing X-ray metrol more

  • Sartorius metrology expert Veronika Martens receives OIML Medal

    Sartorius staff member and metrology expert Veronika Martens was awarded a medal of the International Organization of Legal Metrology (OIML) for her outstanding accomplishments. By conferring this OIML Medal, the organization honors people who have exceptionally contributed to the further developmen more

  • ZEISS Executive Board enlarged

    The start of calendar year 2014 will see some changes to the Executive Board of Carl Zeiss AG headed by President and CEO Dr. Michael Kaschke. The enlargement of the Executive Board and the reallocation of responsibilities are aimed at driving forward the consistent positioning of ZEISS as a portfol more

All news on metrology
Your browser is not current. Microsoft Internet Explorer 6.0 does not support some functions on Chemie.DE