In microsystems metallic components are increasingly being replaced by those from low-cost polymers. For the thickness measurement of polymers, there is now the DIN standard 32567 available, which describes both, optical and tactile surface measuring methods for the precise measurement of the thickn more
Measurement of the dynamic mechanical properties of viscous materials
Bruker completes acquisition of Jordan Valley Semiconductors Ltd.
Bruker Corporation announced the closing of its acquisition of Jordan Valley Semiconductors Ltd., a major provider of X-ray metrology and defect-detection equipment for semiconductor process control. The addition of Jordan Valley’s innovative in-line X-ray metrology to Bruker’s existing X-ray metrol more
Sartorius metrology expert Veronika Martens receives OIML Medal
Sartorius staff member and metrology expert Veronika Martens was awarded a medal of the International Organization of Legal Metrology (OIML) for her outstanding accomplishments. By conferring this OIML Medal, the organization honors people who have exceptionally contributed to the further developmen more